Interferences of Electromagnetic Pulses on Microcontroller Units

In this study, electromagnetic interference testing of microcontroller units (MCUs) under different pulse (EMP) amplitudes, full width at half maximum (FWHM), and angles was carried out on an EMP cell. The coupling path the radiation-type experiment circuit board is random. However, in several experiments with two pins specific to a certain integrated circuit, by measuring voltage MCU pins, statistical results indicate that as pressure air gap switch power source increased, both breakdown electric field transverse (TEM) cell resulting higher (EMI) received these pins. As capacitance storage capacitor EMI also increased. addition, showed had strong directionality; i.e., selectivity, which related structure MCU. X-ray imaging destroyed when internal wiring direction pin consistent propagation pulse, minimal or even unnoticeable.